Cui Daling

Cui Daling
Tel.: +1 (514) 228-6971
Fax: +1 (450) 929-8102
daling.cui@emt.inrs.ca

One of my projects involves investigation of stress-induced optical changes in core-shell QDs, the experiment is based on the production of pure and core-shell QDs and the investigation of the optical and structure properties of QDs in a wide range of temperature. The main characterization method is a temperature-variable XRD measurement.
The other one is FET measurement of the electrical behavior of pure and core-shell QDs. We will characterize properties of QDs with AFM and XPS.

Background: Bachelor in Applied Physics, Tianjin Univercity, China, July 2012