Dynamic Microscopy

DTEMHigh-resolution electron microscopes give us access to a wealth of information contained in the Lilliputian world that exists below the resolution of traditional optical lenses. However, the ‘frame rate’ of these microscopes has historically been a barrier to their use for studying processes that are both extremely small and extremely fast. One solution to breaking this speed limit is by use of dynamic transmission electron microscopy (DTEM), by which we have been able to observe and study such phenomena as the explosive crystallization process in amorphous germanium and silicon films.

INRS-EMT will be the first institution in Canada to acquire a state-of-the-art DTEM microscope, which will permit the observation of nano-sized features at time resolutions of nanoseconds or better.